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Microprocessor IDDQ testing: a case study

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3 Author(s)
D. Josephson ; Hewlett-Packard Co., Fort Collins, CO ; M. Storey ; D. Dixon

The author describe their incorporation of IDDQ testing into the design of the PA-7100LC PA-RISC microprocessor. They also discuss design guidelines, measurement techniques, results after fabrication and volume production, and suggested improvement. Their 900,000-transistor custom design supports IDDQ testing to ensure high quality without compromising 100-MHz-plus performance

Published in:

IEEE Design & Test of Computers  (Volume:12 ,  Issue: 2 )