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Analog checkers with absolute and relative tolerances

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4 Author(s)
Kolarik, V. ; TIMA/INPG Lab., Grenoble, France ; Mir, S. ; Lubaszewski, M. ; Courtois, B.

The design of checkers aimed at the concurrent test of analog and mixed-signal circuits is considered in this paper. These checkers can on-line test duplicated and fully differential analog circuits. The test approach is based on exploiting the inherent redundancy of these circuits which results in the use of a code for the analog signals. The analog code is monitored by the checkers. An error signal which complies with existing digital self-checking parts is generated in the case that a code fails out of the valid code space. For the verification of the analog codes, absolute tolerance margins and tolerance margins which are made relative to signal amplitude are considered. A test pattern generator for off-line testing of the checkers is proposed

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:14 ,  Issue: 5 )