By Topic

Fault coverage estimation by test vector sampling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Heragu, K. ; Rutgers Univ., Piscataway, NJ, USA ; Agrawal, V.D. ; Bushnell, M.L.

We have developed a new statistical technique for estimating delay fault coverage in combinational circuits. True value simulation is performed for a sample of vector pairs chosen randomly from the test set. Transition probabilities and observabilities are estimated from the simulation data. These allow us to estimate fault detection probabilities per vector pair. Fault models considered are the transition faults, path delay faults, and the longest path delay faults. We analyze the vector sampling error and find a high-confidence lower bound for the detection probability that is used to compute the fault coverage for the entire vector set. Experimental results show that vector sampling can provide a close approximation to other methods. It requires reduced computing resources compared to other statistical methods. The savings over fault simulation is even greater

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:14 ,  Issue: 5 )