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Singlemode 1.3 μm Fabry-Perot lasers by mode suppression

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4 Author(s)
Kozlowski, D.A. ; Dept. of Eng., Cambridge Univ., UK ; Young, S. ; England, J.M.C. ; Plumb, R.G.S.

Focused Ga+ ion beam etched pits are used to simulate defects, reflective and nonradiative, in conventional 1.3 μm Fabry-Perot lasers. Combination of three defect sites positioned along the lasing filament results in a quasi-singlemode laser with 30 dB mode suppression and negligible rises in threshold current. The authors also report the appearance of a single enhanced spectral line below threshold

Published in:

Electronics Letters  (Volume:31 ,  Issue: 8 )