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Tri-service automatic test system R&D program

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2 Author(s)
W. R. Simpson ; Inst. for Defense Anal., Alexandria, VA, USA ; R. M. Rolfe

Recent changes in the state-of-the-art in software development and test instrumentation has provided the Department of Defense with opportunities to reduce the cost of its automatic test systems (automatic test equipment and the software and information required to drive that equipment). In order to guide and enhance this evolution, the three Services (USN, USAF, USA) have developed an automatic test system research and development program consisting of three broad areas; automatic test system functional interface convergence, next generation test environment, and automatic test system modernization methods. This program, when funded, will provide the technology necessary to transition to the open architecture test systems of the future. The balance of this paper covers the eleven identified tasks under these broad areas, and how they form a coordinated, integrated basis for an improved acquisition strategy

Published in:

AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.

Date of Conference:

20-22 Sep 1994