Referenced Items are not available for this document.
This paper describes the methodology and tools being developed under the Virtual Test (VTest) Program sponsored by Wright Laboratory's, Manufacturing Technology Directorate. The VTest system will be a commercially available, test system independent, Integrated Process/Product Development (IP/PD) solution for the design and virtual testing of electronic circuits. The methodology and tools developed under the VTest program will provide measurable benefits to enterprises who have spread the printed circuit assembly (PCA) and line replaceable module (LRM) life-cycle across more than one location or test system, electrical design and manufacturing companies and electrical service depots
Date of Conference: 20-22 Sep 1994
- Page(s):
- 495 - 501
- Meeting Date :
- 20 Sep 1994-22 Sep 1994
- Print ISBN:
- 0-7803-1910-9
- INSPEC Accession Number:
- 4910320
- Conference Location :
- Anaheim, CA
- Digital Object Identifier :
- 10.1109/AUTEST.1994.381578
- Product Type:
- Conference Publications
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