Cart (Loading....) | Create Account
Close category search window
 

A decision-theoretic approach to the generation of side information in frequency-hop multiple-access communications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Baum, C.W. ; Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA ; Pursley, M.B.

The use of side information can provide increased coding gains in frequency-hop multiple-access communication systems. The internal generation of this side information by the receiver is investigated in the paper. Methods to determine which received signals to erase prior to decoding are derived from Bayesian decision theory. The performance of synchronous and asynchronous frequency-hop systems with Reed-Solomon coding is analyzed for channels with Rayleigh fading, multiple-access interference, and wideband Gaussian noise. The performance of the Bayesian technique is compared with that of receivers that make erasure decisions using the Viterbi ratio-threshold test. The Bayesian method is found to provide better performance.<>

Published in:

Communications, IEEE Transactions on  (Volume:43 ,  Issue: 2/3/4 )

Date of Publication:

Feb./March/April 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.