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Circuit partitioning for pipelined pseudo-exhaustive testing using simulated annealing

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4 Author(s)
Liou, H.-Y. ; Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA ; Lin, T.T.Y. ; Lung-Tien Liu ; Chung-Kuan Cheng

A novel approach for partitioning circuits with high fan-ins which are not suitable for pseudo-exhaustive testing is presented. Circuits under test (CUTs) are modeled as directed graphs and cost function is developed for the optimization algorithm. Disjoint circuit partitions are generated not only for reducing the exhaustive test length but also for pipelined testing. Experiments on benchmark circuits demonstrate that simulated annealing produces good results for future applications

Published in:

Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994

Date of Conference:

1-4 May 1994