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LAYIN: toward a global solution for parasitic coupling modeling and visualization

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4 Author(s)
F. J. R. Clement ; Electron. Lab., Swiss Federal Inst. of Technol., Zurich, Switzerland ; E. Zysman ; M. Kayal ; M. Declercq

A CAD tool dedicated to parasitic substrate coupling modeling and visualization is presented. A CIF representation of the layout and a specific technology description are used to extract a simple parasitic substrate coupling model. The output is SPICE compatible and includes a geometrical information that is used to show on the layout the distribution of the equipotential lines produced by a perturbing source. Results are compared with measurements and other simulators to demonstrate the accuracy of the model

Published in:

Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994

Date of Conference:

1-4 May 1994