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A cost minimization approach to edge detection using simulated annealing

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3 Author(s)
Tan, H.L. ; Comput. Vision & Image Process. Lab., Purdue Univ., West Lafayette, IN, USA ; Gelfand, S.B. ; Delp, E.J.

Edge detection is analyzed as a problem in cost minimization. A cost function is formulated that evaluates the quality of edge configurations. A mathematical description of edges is given, and the cost function is analyzed in terms of the characteristics of the edges in minimum-cost configurations. The cost function is minimized by the simulated annealing method. A novel set of strategies for generating candidate states and a suitable temperature schedule are presented. Sequential and parallel versions of the annealing algorithm are implemented and compared. Experimental results are presented

Published in:
Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on

Date of Conference: 4-8 Jun 1989

Page(s):
86 - 91
Meeting Date :
04 Jun 1989-08 Jun 1989
ISSN :
1063-6919
Print ISBN:
0-8186-1952-x
INSPEC Accession Number:
3471655
Conference Location :
San Diego, CA
Digital Object Identifier :
10.1109/CVPR.1989.37832
Product Type:
Conference Publications

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