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Reflectometer calibration using planar NiCr thin-film resistors and an open circuit

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1 Author(s)
U. Stumper ; Physikalisch Tech. Bundesanstalt, Braunschweig, Germany

A method for determining the three error-box parameters of complex reflectometers is reported. A set of planar NiCr thin-film resistors mounted in identical coaxial connectors and only an open circuit are used. A comparison of reflection measurements obtained with the new method with measurements obtained using the “quarter wavelength” technique shows good agreement between results in the megahertz range

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:44 ,  Issue: 2 )