By Topic

Reflectometer calibration using planar NiCr thin-film resistors and an open circuit

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Stumper, U. ; Physikalisch Tech. Bundesanstalt, Braunschweig, Germany

A method for determining the three error-box parameters of complex reflectometers is reported. A set of planar NiCr thin-film resistors mounted in identical coaxial connectors and only an open circuit are used. A comparison of reflection measurements obtained with the new method with measurements obtained using the “quarter wavelength” technique shows good agreement between results in the megahertz range

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:44 ,  Issue: 2 )