Reflectometer calibration using planar NiCr thin-film resistors and an open circuit

A method for determining the three error-box parameters of complex reflectometers is reported. A set of planar NiCr thin-film resistors mounted in identical coaxial connectors and only an open circuit are used. A comparison of reflection measurements obtained with the new method with measurements obtained using the "quarter wavelength" technique shows good agreement between results in the megahertz range.<
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