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Improved error correction technique for on-wafer lightwave measurements of photodetectors

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3 Author(s)
P. Debie ; Dept. of Inf. Technol., Ghent Univ., Belgium ; L. Martens ; D. Kaiser

An accurate correction technique for on-wafer small-signal lightwave measurements of photodetectors is presented. This technique is an improvement of the conventional calibration methods for on-wafer lightwave measurements. Mathematical expressions for the dominant error sources that exist in the measurement system are derived. Experimental results for an InGaAs-InP pin photodiode show a smoother modulation response characteristic when the presented technique is used.<>

Published in:

IEEE Photonics Technology Letters  (Volume:7 ,  Issue: 4 )