Cart (Loading....) | Create Account
Close category search window

CACOP-a random pattern testability analyzer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wen-Ben Jone ; Dept. of Comput. Sci. & Inf. Eng., Nat. Chung-Cheng Univ., Taiwan ; Das, S.R.

In this paper a new method called CACOP For the detection probability analyses of random test patterns is proposed. Considering computational complexity, CACOP is a compromise between O(n2) testability analyses like full-range cutting algorithm (FRCA) and linear time testability analyses like the controllability observability program (COP). By propagating bounds of controllabilities and observabilities, CACOP can determine the detection probability lower bound (DPLB) efficiently. The DPLBs derived by CACOP are potentially higher (and thus more accurate) than by FRCA; in addition, CACOP is computationally more efficient than FRCA. The conventional linear time testability analyses cannot guarantee the derivation of DPLBs. On the contrary, CACOP can achieve the goal with tolerable increase in computing complexity

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:25 ,  Issue: 5 )

Date of Publication:

May 1995

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.