Behavioral testability and test pattern generation of the Hopfield network model

The problem of testability and test pattern generation at the highest abstraction level, i.e., based on the network's behavior, is considered for Hopfield networks. Complete testability is proved. A test pattern generation approach based on creation of an equivalent finite state machine is presented, the functional test pattern generation have been proved to allow very high coverage of logic-level faults in the case of finite state machines. An efficient algorithm, using BDDs, is finally described.<
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