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Scale and rotation invariant pattern recognition using complex-log mapping and translation invariant neural network

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3 Author(s)
Heung-Ho Lee ; Dept. of Electr. Eng., Chung Nam Nat. Univ., Taejon, South Korea ; Hee-Yong Kwon ; Hee-Yeung Hwang

In this paper, we propose a scale and rotation invariant pattern recognition system using complex-log mapping (CLM) and translation invariant neural network (TINN). CLM is very useful for extracting scale and rotation invariant features. However, the results are given in a wrap-around translated form, which requires subsequent wrap-translation invariant recognition steps. This problem can be solved by using an augmented second order neural network (SONN). It requires, however, a connection complexity O(n2) for input feature extraction which is too high to be implemented. The proposed method reduces the connection complexity to O(n*log(n)) by using TINN. Experimental results show that the recognition performance of the proposed method is almost the same as that of SONN while its network size is significantly reduced

Published in:

Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on  (Volume:7 )

Date of Conference:

27 Jun-2 Jul 1994

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