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A Bayes empirical-Bayes model for software reliability

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2 Author(s)
T. A. Mazzuchi ; George Washington Univ., Washington, DC, USA ; R. Soyer

The authors present a model for the behavior of software failures. Their model fits into the general framework of empirical Bayes problems; however, they take a proper Bayes approach for inference by viewing the situation as a Bayes empirical-Bayes problem. An approximation due to D.V. Lindley (1980) plays a central role in the analysis. They show that the Littlewood-Verall model (1973) is an empirical Bayes model and discuss a fully Bayes analysis of it using the Bayes empirical-Bayes setup. Finally, they apply both models to some actual software failure data and compare their predictive performance

Published in:

IEEE Transactions on Reliability  (Volume:37 ,  Issue: 2 )