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Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis

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5 Author(s)
Deb, S. ; Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA ; Pattipati, K.R. ; Raghavan, V. ; Shakeri, M.
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In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting

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Aerospace and Electronic Systems Magazine, IEEE  (Volume:10 ,  Issue: 5 )