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Automatic generation of analytical models for interconnect capacitances

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2 Author(s)
U. Choudhury ; Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA ; A. Sangiovanni-Vincentelli

An analytical-model generator for interconnect capacitances is presented. It obtains analytical expressions of self and coupling capacitances of interconnects for commonly encountered configurations, based on a series of numerical simulations and a partial knowledge of the flux components associated with the configurations. The configurations which are currently considered by this model generator are: (a) single line; (b) crossing lines; (c) parallel lines on the same layer; and (d) parallel lines on different layers (both overlapping and nonoverlapping)

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:14 ,  Issue: 4 )