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Reliability of new semiconductor devices for long-distance optical submarine-cable systems

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2 Author(s)
Tatekura, K. ; Kokusai Denshin Denwa Co. Ltd., Tokyo, Japan ; Niro, Y.

Results from reliability tests conducted on three types of semiconductor devices used in optical repeaters are reported. The devices tested are: two types of 1.3-μm-band InGaAsP/InP laser diodes: a Ge avalanche photodiode; and monolithic integrated circuits. The devices have proved to be suitable for use in a long-distance optical submarine-cable system, such as the third transpacific cable system

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Reliability, IEEE Transactions on  (Volume:37 ,  Issue: 1 )