Close category search window
 

Characterization of distributions by relationships between failure rate and mean residual life

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ruiz, J.M. ; Dept. de Matematica Aplicada y Estadistica, Murcia Univ., Spain ; Navarro, J.

The characterizations described use relations between the failure rate function and conditional expectation. The theorems proved here extend the results of some authors and can be used in the context of the renewal process. The utility of these results is demonstrated by using them to characterize some common distributions

Published in:
Reliability, IEEE Transactions on  (Volume:43 ,  Issue: 4 )

Date of Publication: Dec 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.