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Structural analysis of materials by X-ray diffraction

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1 Author(s)
Jutson, J.A. ; BICC Cables Ltd., Wrexham, UK

X-ray diffraction is an important and useful technique in solid state chemistry and has been used since the beginning of this century in the characterisation of crystalline materials. The examples described here give some idea of the wide spectrum of applications of diffraction techniques, and in particular the measurement of properties that could affect the performance of dielectrics. Other applications include determination of crystal structure, stress measurements and quantitative analysis

Published in:

Characterisation of Dielectric Materials: a Review, IEE Colloquium on

Date of Conference:

13 Apr 1994