Cart (Loading....) | Create Account
Close category search window
 

On the relationship between partition and random testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chen, T.Y. ; Dept. of Comput. Sci., Melbourne Univ., Parkville, Vic., Australia ; Yu, Y.T.

Weyuker and Jeng (ibid., vol. SE-17, pp. 703-711, July 1991) have investigated the conditions that affect the performance of partition testing and have compared analytically the fault-detecting ability of partition testing and random testing. This paper extends and generalizes some of their results. We give more general ways of characterizing the worst case for partition testing, along with a precise characterization of when this worst case is as good as random testing. We also find that partition testing is guaranteed to perform at least as well as random testing so long as the number of test cases selected is in proportion to the size of the subdomains

Published in:

Software Engineering, IEEE Transactions on  (Volume:20 ,  Issue: 12 )

Date of Publication:

Dec 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.