Cart (Loading....) | Create Account
Close category search window
 

Adaptive whole-field optical profilometry: a study of the systematic errors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Biancardi, L. ; Dipartimento di Elettronica per l''Automazione, Brescia Univ., Italy ; Sansoni, G. ; Docchio, F.

An analysis of the sources of systematic errors in an optical whole-field profilometer based on the projection of fringes is presented here. In the system, the determination of the object profile is performed by triangulation. Both the period of the fringes and the geometrical system parameters on which triangulation operates (i.e. the distance between the object and the acquisition/projection units, and the distance between the acquisition unit and the projection unit) represent the input parameters of the profile evaluation algorithm. The influence on the height error introduced by an inaccuracy in the determination of the projected fringe period, as well as of the geometrical parameters of the system, is investigated here. The distortion in reconstructing the object shape due to the finite distance illumination scheme used in the system is also studied. The results obtained from the analysis are used to increase the accuracy at the optical profilometer by means of a suitably developed correction algorithm

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:44 ,  Issue: 1 )

Date of Publication:

Feb 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.