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Fault detection by transient transition count testing

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4 Author(s)
Kuo Chan Huang ; Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Ming Yu Chen ; Chung Len Lee ; Chen, J.E.

A new testing scheme, transient transition count (TTC) testing, which is able to detect hard-to-test faults and redundant faults, in addition to conventional stuck-at faults, is proposed. The scheme is based on applying a pair of transition patterns and observing the transition count of the transient output response of a circuit to defect faults. A fast and memory-efficient fault simulator which is based on PPSFP mechanism but can handle timing is implemented. Experimental results show that this scheme can reach a higher fault coverage than the conventional stuck-at fault testing

Published in:

Test Symposium, 1994., Proceedings of the Third Asian

Date of Conference:

15-17 Nov 1994