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Application of byte error detecting codes to the design of self-checking circuits

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2 Author(s)
Pagey, S. ; Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada ; Al-Khalili, A.J.

In this paper, we discuss the application of byte error detecting codes to the design of self-checking circuits for the single stuck-at fault model. We discuss strongly fault-secure realization of a given Boolean function using byte error detecting codes. Even though parity is the most efficient separable code for the detection of single errors, we show that the use of a byte error detecting code can lead to lower cost of self-checking realization of a given function as compared to its self-checking realization using the parity code. We also present a method for the design of totally self-checking checkers for byte error detecting codes. Experimental results obtained for various test circuits are also discussed

Published in:

Test Symposium, 1994., Proceedings of the Third Asian

Date of Conference:

15-17 Nov 1994