By Topic

Application of byte error detecting codes to the design of self-checking circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pagey, S. ; Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada ; Al-Khalili, A.J.

In this paper, we discuss the application of byte error detecting codes to the design of self-checking circuits for the single stuck-at fault model. We discuss strongly fault-secure realization of a given Boolean function using byte error detecting codes. Even though parity is the most efficient separable code for the detection of single errors, we show that the use of a byte error detecting code can lead to lower cost of self-checking realization of a given function as compared to its self-checking realization using the parity code. We also present a method for the design of totally self-checking checkers for byte error detecting codes. Experimental results obtained for various test circuits are also discussed

Published in:

Test Symposium, 1994., Proceedings of the Third Asian

Date of Conference:

15-17 Nov 1994