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Strongly fail-safe interfaces based on concurrent checking

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1 Author(s)
Nicolaidis, M. ; Reliable Integrated Syst. Group, Inst. Nat. Polytech. de Grenoble, France

This paper presents a strongly fail safe interface which transforms binary signals, generated by a system with error detection capabilities and eventually with fault tolerant capabilities, into fail safe signals. That is to say into signals which in the presence of failures will be either correct or safe. The strongly fail-safe property is achieved by means of concurrent checking techniques. The interest of this interface is that it can be implemented in VLSI, while the conventional fail-safe interfaces require to use discrete components

Published in:

Test Symposium, 1994., Proceedings of the Third Asian

Date of Conference:

15-17 Nov 1994