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On the performance analysis of parallel processing for test generation

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3 Author(s)
T. Inoue ; Graduate Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan ; T. Fujii ; H. Fujiwara

The performance of parallel processing for test generation depends on the method of communication among processors. This paper presents two types of parallel processing which differ in communication methods, and analyzes their performance. We formulate the number of test vectors obtained in parallel processing, and analyze the costs of test generation, fault simulation and interprocessor communication and the speedup ratio. Further, we consider a method which minimizes the cost of interprocessor communication

Published in:

Test Symposium, 1994., Proceedings of the Third Asian

Date of Conference:

15-17 Nov 1994