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Design of pseudo-random patterns with low linear dependence and equi-distribution

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3 Author(s)
Matsufuji, S. ; Dept. of Inf. Sci., Saga Univ., Japan ; Tadaki, S.-I. ; Yamanaka, T.

Pseudo-random patterns with equi-distribution given by some phase-shifted M-sequences are often used to produce random numbers used in simulations and test patterns in VLSI tests. Low linear dependency is one of the desirable and important properties of random patterns as well as equi-distribution. This paper discusses pseudo-random patterns with equi-distribution and low linear dependence

Published in:

Test Symposium, 1994., Proceedings of the Third Asian

Date of Conference:

15-17 Nov 1994

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