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Testing complex couplings in multiport memories

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3 Author(s)
Nicolaidis, M. ; Reliable Integrated Syst. Group, Inst. Nat. Polytech. de Grenoble, France ; Alves, V.C. ; Bederr, H.

In this paper, the effects of simultaneous write access on the fault modeling of multiport RAMs are investigated. New fault models representing more accurately the actual faults in such memories are then defined. Subsequently, a general algorithm that ensures the detection of all faults belonging to the new fault model is proposed. Unfortunately, the obtained algorithms are of O(n/sup 2/) complexity which is not practical for real purposes. In order to reduce the complexity of the former test algorithm a topological approach has been developed. Finally, a BIST implementation of one of the proposed topological algorithms is presented.<>

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Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:3 ,  Issue: 1 )