Cart (Loading....) | Create Account
Close category search window
 

An algorithm for a real time measurement of nonlinear transition shift by a time domain correlation analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Guo Mian ; Conner Peripherals, San Jose, CA, USA

An algorithm has been developed for a real time measurement of the nonlinear transition shift in high areal density magnetic recording, by a time domain correlation analysis. By measuring SNR and a correlation coefficient of the time domain readback voltages, r[/spl nu/(t), /spl nu/(t+/spl epsiv//2+(M/sub 1/-1/2)T)], written by a pseudorandom sequence, we can determine the nonlinear transition shift in real time. This new algorithm not only simplifies data processing of the readback waveform, but also includes noise effects on the nonlinear transition shift measurement. This algorithm has been implemented by LeCroy Corporation into their 7200-A high-speed digital oscilloscope. The LeCroy oscilloscope measures the nonlinear transition shift in less than 100 ms utilizing this algorithm.<>

Published in:

Magnetics, IEEE Transactions on  (Volume:31 ,  Issue: 1 )

Date of Publication:

Jan. 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.