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Sequentially t-diagnosable systems: a characterization and its applications

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2 Author(s)
Xu, J. ; Dept. of Comput. Sci., Chongqing Univ., China ; Shi-Ze Huang

In the system level fault diagnosis area, the fundamental problem of characterizing sequentially t-diagnosable systems in the PMC model has remained open for more than two decades. We resolve this problem by providing a complete characterization of such systems. Our solution to the characterization problem leads to the correct identification of optimal sequentially t-diagnosable Dδ,k systems. Given a set of n units where n=2t+1, an optimal Dδ,k system can be constructed with just n([(t+2)/3]) tests, rather than n([t/2]+1) tests-a previously misjudged bound. An efficient algorithm for identifying the set of faulty units in a sequentially t-diagnosable D δ,k system is given along the line of the proposed characterization, which is linear with respect to the number of tests in the system

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Computers, IEEE Transactions on  (Volume:44 ,  Issue: 2 )