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On fault simulation for synchronous sequential circuits

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2 Author(s)
Pomeranz, I. ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Reddy, S.M.

We investigate the considerations to be employed in designing a fault simulator for synchronous sequential circuits described at the gate level. Three testing strategies and three methods of handling unknown state variable values are considered. Every combination of a test strategy and a method of handling unknown state variable values defines a different fault simulation procedure. Experimental results are presented to demonstrate the different fault coverage levels achievable by the various procedures. Based on these results, a fault simulation procedure that combines the various considerations is proposed

Published in:

Computers, IEEE Transactions on  (Volume:44 ,  Issue: 2 )

Date of Publication:

Feb 1995

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