Close category search window
 

Correction of errors due to airgaps for microwave complex permittivity measurement using a coaxial line

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Arai, M. ; Dept. of Mater. Eng. & Mater. Design, Nottingham Univ., UK ; Binner, J.G.P. ; Cross, T.E.

Microwave complex permittivity of PTFE (Teflon) was measured using a transmission/reflection (TR) method and a coaxial sample fixture. A range of sample dimensions were prepared in order to examine the effect of airgaps on the measured permittivities. The measurements were compared with calculated values using a formula derived by considering the total capacitance

Published in:
Electronics Letters  (Volume:31 ,  Issue: 2 )

Date of Publication: 19 Jan 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.