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7-μm-cutoff PtSi infrared detector for high sensitivity MWIR applications

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7 Author(s)
Lin, T.L. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Park, J.S. ; Gunapala, S.D. ; Jones, E.W.
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PtSi Schottky infrared detectors with extended cutoff wavelengths of 5.7, 6.6, and 7.3 /spl mu/m have been demonstrated by incorporating a thin p+ layer at the PtSi-Si interface for high sensitivity medium wavelength infrared imaging applications. The response uniformity of the 7-/spl mu/m cutoff detector was studied.<>

Published in:

Electron Device Letters, IEEE  (Volume:16 ,  Issue: 3 )

Date of Publication:

March 1995

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