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7-μm-cutoff PtSi infrared detector for high sensitivity MWIR applications

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7 Author(s)
T. L. Lin ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; J. S. Park ; S. D. Gunapala ; E. W. Jones
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PtSi Schottky infrared detectors with extended cutoff wavelengths of 5.7, 6.6, and 7.3 μm have been demonstrated by incorporating a thin p+ layer at the PtSi-Si interface for high sensitivity medium wavelength infrared imaging applications. The response uniformity of the 7-μm cutoff detector was studied.

Published in:

IEEE Electron Device Letters  (Volume:16 ,  Issue: 3 )