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Test and screening strategies for large memories

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3 Author(s)
Birolini, A. ; Dept. of Electr. Eng., Swiss Federal Inst. of Technol., Zurich, Switzerland ; Buchel, W. ; Heavner, D.

The possibilities and limits of testing and screening large memories are reviewed. Practical results are given. The procedures for the qualification test of different types of memories are discussed. The concept of test strategy is introduced. Future trends in testing large memories are presented. It is shown that AC, functional, and DC test should be performed under several different conditions to help determine the correct testing strategy

Published in:

European Test Conference, 1989., Proceedings of the 1st

Date of Conference:

12-14 Apr 1989

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