Referenced Items are not available for this document.
Higher-level test techniques for acceptance testing are described, and the implications of such testing at various levels are analyzed. Simulated tests involving autonomous interfacing units are also discussed. The testing at the card level is batch-oriented and goes through automated or semiautomated testing schemes
Published in:
European Test Conference, 1989., Proceedings of the 1st
Date of Conference: 12-14 Apr 1989
- Page(s):
- 221 - 228
- Meeting Date :
- 12 Apr 1989-14 Apr 1989
- Print ISBN:
- 0-8186-1937-6
- INSPEC Accession Number:
- 3471798
- Conference Location :
- Paris
- Digital Object Identifier :
- 10.1109/ETC.1989.36247
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