Cart (Loading....) | Create Account
Close category search window
 

Analysis of arbitrarily shaped two-dimensional microwave circuits by finite-difference time-domain method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Gwarek, W.K. ; Inst. of Radioelectron., Warsaw Univ. of Technol., Poland

A version of the finite-difference time-domain method adapted to the needs of S-matrix calculations of microwave two-dimensional circuits is presented. The analysis is conducted by simulating the wave propagation in the circuit terminated by matched loads and excited by a matched pulse source. Various aspects of the method's accuracy are investigated. Practical computer implementation of the method is discussed, and an example of its application to an arbitrarily shaped microstrip circuit is presented. It is shown that the method in the proposed form is an effective tool of circuit analysis in engineering applications. The method is compared to two other methods used for a similar purpose, namely the contour integral method and the transmission-line matrix method

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:36 ,  Issue: 4 )

Date of Publication:

Apr 1988

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.