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CONT: a concurrent test generation system

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2 Author(s)
Takamatsu, Y. ; Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan ; Kinoshita, K.

A test pattern generating system, CONT (CONcurrent Test generation) is discussed. The CONT system consists of two modes for test generation, TGM-C (CONT algorithm) and TGM-S. The TGM-C (test generation mode with concurrency) generates fault lists concurrently in order to speed up test generation. In the process of test generation with TGM-C, the primary input value is not changed but a target fault is switched to another one using the fault list when backtrack occurs. The TGM-S (test generation mode with a single target fault) generates a test pattern without changing a target fault. Experimental results show that the CON system is an efficient test generation system

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:8 ,  Issue: 9 )

Date of Publication:

Sep 1989

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