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Circuit optimization: the state of the art

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2 Author(s)
Bandler, J.W. ; Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada ; Shao Hua Chen

The authors review the current state of the art in circuit optimization, emphasizing techniques suitable for modern microwave CAD (computer-aided design). The main thrust in the field is currently the solution of realistic design and modeling problems, addressing such concepts as physical tolerances and model uncertainties. A unified hierarchical treatment of circuit models forms the basis of the presentation. It exposes tolerance phenomena at different parameter/response levels. The concepts of design centering, tolerance assignment, and postproduction tuning in relation to yield enhancement and cost reduction suitable for integrated circuits are discussed. Suitable techniques for optimization oriented worst-case and statistical design are reviewed. A generalized lp centering algorithm is proposed and discussed. Multicircuit optimization directed at both CAD and robust device modeling is formalized. Tuning is addressed in some detail, both at the design stage and for production alignment. State-of-the-art gradient-based nonlinear optimization methods are reviewed with emphasis given to recent, but well tested, advances in minimax, l1, and l2 optimization

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:36 ,  Issue: 2 )

Date of Publication:

Feb 1988

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