Cart (Loading....) | Create Account
Close category search window
 

Analysis of finite aperture effect in the modified MIL-STD-285 shielding material's test method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kiener, S. ; Mothesim, Le Plessis-Robinson, France ; Nishikata, A.

The theoretical basis for SE (shielding effectiveness) values obtained from the Modified MIL-STD-285 Shielding Material's Test Method is investigated. The magnetic loop measurement is considered with a circular aperture on an infinitely-thin perfect conductor wall. When the aperture size is large enough to the wall-to-antenna distance, a rigorous integral formula for dipole source shielding by an infinitely-large plane shield gives the asymptotic value. When the aperture dimension is small enough, the loaded aperture's magnetic polarizability formula quasi-static approximation) can be used, provided the shield is quite thinner than skin depth. For the intermediate region between these two limited cases, an approximate approach is evaluated which is based on the aperture integral. For more general cases such as for non-circular apertures filled with weak shielding material, the possibility of the use of the IBC (Impedance Boundary Condition) with a full-wave analysis code is discussed

Published in:

Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE

Date of Conference:

10-12 May 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.