By Topic

High-speed measuring system for testing mixed-signal-LSI performance and its application to digital-noise measurement

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
T. Tsukada ; Central Res. Lab., Hitachi Ltd., Tokyo, Japan ; K. Makie-Fukuda ; T. Kikuchi ; M. Hotta
more authors

An automatic measuring system is developed for laboratory use for performance testing and design verification of analog and mixed-signal LSIs. Through the high-speed circuit and board design techniques, an 8-bit 1 GHz arbitrary waveform generator (AWG) and 3 GHz sampling waveform digitizer (SWD) were implemented in the system. This enables the range for measuring high-frequency mixed-signal-LSI performance to be extended from MHz up to GHz. A statistical digital-noise measurement method is presented as an application of the system. The digital-noise performance is automatically analyzed on the system by measuring and processing the statistical output results of the on-chip analog comparators operating on a mixed-signal LSI in order to detect the digital-noise coupling

Published in:

Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE

Date of Conference:

10-12 May 1994