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Multiscale corner detection by using wavelet transform

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3 Author(s)
Jiann-Shu Lee ; Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan ; Yung-Nien Sun ; Chin-Hsing Chen

A multiscale corner detection algorithm based on the wavelet transform of contour orientation is proposed. It can utilize both the information of the local extrema and modulus of transform results to detect corners and arcs effectively. The ramp-width of contour orientation profile, which can be computed using the transformed modulus of two scales, reveals the difference between corner and arc and is utilized in the determination of corner points. The experimental results have shown that the detector is more effective than both the single- and multiple-scale detectors. They also demonstrate that the detector is insensitive to boundary noise. In addition, the proposed method is more efficient than the other multiscale corner detector because it operates on fewer number of scales, which can be implemented by a fast transform algorithm

Published in:

Image Processing, IEEE Transactions on  (Volume:4 ,  Issue: 1 )

Date of Publication:

Jan 1995

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