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Measurement of dielectric loss tangent of alumina at microwave frequencies and room temperature

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4 Author(s)
R. A. Woode ; Dept. of Phys., Western Australia Univ., Nedlands, WA ; E. N. Ivanov ; M. E. Tobar ; D. G. Blair

The use of whispering gallery modes allows the dielectric loss tangent of polycrystalline Al2O3 (alumina) to be accurately determined at microwave frequencies without the use of a cavity. The dielectric loss tangent of alumina is shown to be strongly variable from sample to sample with a lowest measured value of 4.3×10-5 observed at 9.0 GHz in a 99.5% alumina sample

Published in:

Electronics Letters  (Volume:30 ,  Issue: 25 )