Notification:
We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Non-intrusive probing techniques for the characterisation of environments for electromagnetic measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Huang, Y. ; Essex Univ., Colchester, UK ; Edwards, D.J. ; Zhang, S.Q. ; Street, A.M.

An optically modulated scattering technique for the measurement of electromagnetic field inside conducting enclosures is described and applied to electromagnetic compatibility (EMC) and associated fields. The scatterers are tuned dipoles and loops, so as to measure both the electric and magnetic field at low level. The monostatic system employed is flexible and convenient to measure any component of the field. The measurement results are shown to be of high repeatability and accuracy

Published in:

Electromagnetic Compatibility, 1994., Ninth International Conference on

Date of Conference:

5-7 Sep 1994