By Topic

An analytical comparison of the fault-detecting ability of data flow testing techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Frankl, P.G. ; Dept. of Comput. Sci., Polytech. Univ., Brooklyn, NY, USA ; Weyuker, E.J.

Compares several data flow based software testing criteria to one another and to branch testing. The fact that criterion C1 subsumes criterion C2, does not guarantee that C1 is better at detecting faults than C2. However, if a certain stronger relation between the criteria holds, then for any program and any specification, C1 is guaranteed to be better at detecting faults than C2 in the following sense: a test suite selected by independent random selection of one test case from each C1 subdomain is at least as likely to detect a fault as a suite similarly selected using C2. It is shown that under those conditions, the expected number of failure-causing inputs in the C1 test suite. These results are used to compare a number of data flow testing criteria to one another and to branch testing

Published in:

Software Engineering, 1993. Proceedings., 15th International Conference on

Date of Conference:

17-21 May 1993