Cart (Loading....) | Create Account
Close category search window
 

Time-of-flight positron imaging and the resolution improvement by an iterative method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Yamamoto, M. ; Nat. Inst. of Radiol. Sci., Chiba, Japan ; Nohara, N. ; Tanaka, E. ; Tomitani, T.
more authors

A simple time-of-flight (TOF) positron imaging method is proposed in which the spatial resolution obtained with TOF information is improved by a novel iterative algorithm. The prototype has a pair of opposed detectors using BaF2 (2×2×2 cm3) and photomultiplier tubes (18.5-mm diameter). The measured TOF resolution full width at half maximum was 330 ps, which corresponds to 5.0 cm of spatial resolution for source localization between the detectors. Eight iterations with the algorithm improve the spatial resolution by a factor of about two for a point source. The algorithm is based on modifications of a Bayesian deconvolution algorithm. For more complex sources, it takes more iterations (e.g. 80); however the algorithm is about five times faster than the original Bayesian algorithm

Published in:

Nuclear Science, IEEE Transactions on  (Volume:36 ,  Issue: 1 )

Date of Publication:

Feb 1989

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.