IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Nuclear Science, IEEE Transac ...> Volume:36 Issue:1 Help

Time-of-flight positron imaging and the resolution improvement by an iterative method

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Yamamoto, M. ; Nat. Inst. of Radiol. Sci., Chiba, Japan ; Nohara, N. ; Tanaka, E. ; Tomitani, T.
more authors

A simple time-of-flight (TOF) positron imaging method is proposed in which the spatial resolution obtained with TOF information is improved by a novel iterative algorithm. The prototype has a pair of opposed detectors using BaF2 (2×2×2 cm3) and photomultiplier tubes (18.5-mm diameter). The measured TOF resolution full width at half maximum was 330 ps, which corresponds to 5.0 cm of spatial resolution for source localization between the detectors. Eight iterations with the algorithm improve the spatial resolution by a factor of about two for a point source. The algorithm is based on modifications of a Bayesian deconvolution algorithm. For more complex sources, it takes more iterations (e.g. 80); however the algorithm is about five times faster than the original Bayesian algorithm

Published in:
Nuclear Science, IEEE Transactions on  (Volume:36 ,  Issue: 1 )

Date of Publication: Feb 1989

Page(s):
998 - 1002
ISSN :
0018-9499
INSPEC Accession Number:
3401779
Digital Object Identifier :
10.1109/23.34592
Product Type:
Journals & Magazines
Date of Current Version :
06 August 2002
Issue Date :
Feb 1989
Sponsored by :
IEEE Nuclear and Plasma Sciences Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.