Multiple stuck-at fault test generation techniques for combinational circuits based on network decomposition

This paper introduces a technique to detect multiple stuck-at faults in combinational circuits. The method is based on the concept of network decomposition, and allows near optimal test generation with ease of computation for most circuits. The procedure involves breaking down complex networks into small blocks, solving the test generation problem for each of these blocks, and properly integrating the results into the complete test set for the original circuit