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Measurement of digital noise in mixed-signal integrated circuits

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4 Author(s)
K. Makie-Fukuda ; Central Res. Lab., Hitachi Ltd., Tokyo, Japan ; T. Kikuchi ; T. Matsuura ; M. Hotta

This paper proposes a method of measuring the influence of digital noise on analog circuits using wide-band voltage comparators as noise detectors. Noise amplitude and r.m.s voltage are successfully measured by this method. A test chip is fabricated to measure the digital noise influence. From the experimental results, it is shown that the digital noise influence can be considerably reduced by using a differential configuration in analog circuits for mixed-signal IC's. The digital noise influence can be further reduced by lowering the digital supply voltage. These results show that the voltage-comparator-based measuring method is effective in measuring the influence of digital noise on analog circuits

Published in:

IEEE Journal of Solid-State Circuits  (Volume:30 ,  Issue: 2 )