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VLSI design and test: a unified approach

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1 Author(s)
Serra, M. ; Dept. of Comput. Sci., Victoria Univ., BC, Canada

An outline of a complete program for the teaching of advanced courses in design and testing of VLSI circuits is given. The program attempts to present a unified approach to design methodologies and testing algorithms. These two aspects of VLSI design lead to the explicit issues of testability and design for testability. The students are given choices of courses, but also a coherent guideline to form a useful and stimulating overall program, whether their specialty lies within electrical engineering or computer science. Links are made in the courses to encompass topics from technology and electronics to software development for CAD (computer-aided design) packages. Some aspects of research in the field of fault detection are briefly discussed. The curricula and descriptions for some courses representing effort undertaken by the author are outlined

Published in:

Education, IEEE Transactions on  (Volume:32 ,  Issue: 3 )