Cart (Loading....) | Create Account
Close category search window
 

Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Melinger, J.S. ; Naval Res. Lab., Washington, DC, USA ; Buchner, S. ; McMorrow, D. ; Stapor, W.J.
more authors

In this paper we present an evaluation of the pulsed laser as a technique for single events effects (SEE) testing. We explore in detail the important optical effects, such as laser beam propagation, surface reflection, and linear and nonlinear absorption, which determine the nature of laser-generated charge tracks in semiconductor materials. While there are differences in the structure of laser- and ion-generated charge tracks, we show that in many cases the pulsed laser remains an invaluable tool for SEE testing. Indeed, for several SEE applications, we show that the pulsed laser method represents a more practical approach than conventional accelerator-based methods.<>

Published in:

Nuclear Science, IEEE Transactions on  (Volume:41 ,  Issue: 6 )

Date of Publication:

Dec. 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.